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Compuware Publishes Application Performance Almanac – 2012 Issue
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Wednesday, February 08, 2012:
Compuware Corporation (Nasdaq:CPWR), the technology performance company, today announced the publication of the 2012 issue of its industry-leading Application Performance Almanac. The Almanac provides 400 pages of in-depth guidance and actionable information on how best to leverage application performance management (APM) solutions to help organizations optimize performance across production, test and development environments.
The 2012 Issue of the Compuware dynaTrace Application Performance Almanac is available as a free resource and features articles on numerous APM topics written by four of the industry’s experts over the past year. The Almanac covers topics that range from technical implementation to conceptual areas of performance management, around six key themes:
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• Web Performance Optimization / AJAX
• Cloud/NoSQL/Big Data
• Production/DevOps
• Mobile
• Automation/Continuous Integration / Test
• Performance Tuning for Java and .NET
Popular articles include: “Why Performance Management is Easier in Public Than On-Premise Clouds,” “Testing and Optimizing Single Page Web 2.0/AJAX Applications – Why Best Practices Alone Don’t Work Anymore” and “How Garbage Collection Differs in the Three Big JVMs” and more.
The dynaTrace Application Performance Almanac Issue 2012 is available for download at: http://bit.ly/y0OSyq.
“The Almanac is a source of knowledge, providing valuable information for all business and technical stakeholders across the lifecycle of their systems and services. We compiled this guide to be of interest to anyone concerned about performance in production, test or development,” said Alois Reitbauer, dynaTrace Technology Strategist. “When combined with our 2011 Issue, the dynaTrace Application Performance Almanac series provides over 100 articles of APM information.” The authors, all members of the dynaTrace APM Center of Excellence, include Alois Reitbauer, Andreas Grabner, Michael Kopp and Klaus Enzenhofer.
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