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NI To Demonstrate New PXI Test Solutions For Mobile Devices @ MWC
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Wednesday, February 22, 2012:
Who: David Loadman, vice president of mobile device test at National Instruments, with NI test product engineers
What: Demonstrations include the following PXI test systems:
· Mobile device validation and production test system for cellular and wireless connectivity for LTE, WCDMA, GSM/EDGE, Bluetooth and WLAN
· Test solution for 802.11ac chipsets and devices with both Rx and Tx configurations up to 4x4 MIMO including support for 80 MHz and 80+80 MHz (160 MHz)
· Multi-DUT parallel production test solution for mobile handsets demonstrating parallel testing of HDMI video and GPS
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When: February 27 through March 1, 2012
Where: Mobile World Congress, Barcelona, Spain – Hall 2.0, Booth 2B93
Why: Engineers can achieve 5-10X faster test times with NI software-defined PXI test solutions than with traditional rack-and-stack box instruments. These systems are based on multicore processors, field-programmable gate arrays (FPGAs) and high-speed data buses, which provide field upgradability, faster processing, higher bandwidth and scalable support for new cellular and wireless connectivity standards.
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Daily App Review: Klik For iPhone |
| Among all the gadgetry on display in Mission Impossible IV, perhaps the most striking was an iPhone app that could identify people who appeared on the... |
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