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Keithley Publishes E-Guide On Making Ultra-Fast I-V Measurements
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Friday, July 13, 2012:
Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has published an informative e-guide titled “Ultra-Fast I‑V Applications for the Model 4225-PMU Ultra-Fast I-V Module.” A free copy is downloadable upon request from Keithley at: http://www.keithley.com/promo/pr/1107.
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The 24-page e-guide provides an overview of ultra-fast I-V sourcing and measurement and why these have become increasingly important capabilities for many technologies, including compound semiconductors, non-volatile memory (NVM), MEMs devices, nanodevices, solar cells, and CMOS devices. Using pulsed I-V signals to characterize devices rather than DC signals makes it possible to study or reduce the effects of self-heating (joule heating) or to minimize current drift or degradation in measurements due to trapped charge. Transient I-V measurements allow scientists and engineers to capture ultra high speed current or voltage waveforms in the time domain or to study dynamic test circuits.
Pulsed sourcing can be used to stress test a device using an AC signal during reliability cycling or in a multi-level waveform mode to program/erase memory devices.
The Model 4225-PMU Ultra-Fast I-V Module, an option for the Model 4200-SCS Semiconductor Characterization System, supports many of these high speed source/measure applications. Each plug-in Model 4225-PMU module provides two channels of integrated sourcing and measurement but occupies only a single slot in the Model 4200-SCS's nine-slot chassis. Unlike competitive solutions, each channel of the Model 4225-PMU combines high speed voltage outputs (with pulse widths ranging from 60 nanoseconds to DC) with simultaneous current and voltage measurements.
The e-guide outlines a number of the Model 4225-PMU’s key features:
· Integrated high speed sourcing and measurement capabilities, which allow for ultra-fast I‑V testing
· Wide dynamic range of voltage sourcing, current measurement (with auto-ranging), and timing parameters
· Broad array of applications
· Built-in interactive software for easy control
Example applications described include:
· General pulsed I-V testing of devices
· CMOS device characterization
· Non-volatile memory device testing
· Compound semiconductor devices and materials
· Nanotechnology and MEMs devices
· Solar cells
· A broad range of other tests
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