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Monday, August 06, 2012:
Harman Selects Averna to Test Infotainment Systems
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Fully Equipped Averna Test Platform Increases Test Coverage and Throughput
Austin, Texas, August 6, 2012 – Averna, an industry-leading developer of test solutions and services for communications and electronics device-makers worldwide, announced today that Harman has selected Averna’s Infotainment Test Platform for Automated Functional Testing (AFT) and End-of-Line (EOL) testing a line of infotainment receivers.
Averna’s Infotainment Test Platform for Harman can test multiple capabilities of four infotainment receivers at the same time. This all-in-one parallel tester leverages Averna’s RF test expertise as well as advanced test tools such as NI TestStand and LabVIEW. It also features top-of-the-line instruments like an audio signal generator and analyzer, multiple CAN cards, multimeters and I/O cards integrated with custom interfaces.
“We are very pleased to partner with Harman for this important project. With all the new technology and features demanded by consumers, a key to delivering the highest quality infotainment systems is fast, comprehensive and efficient parallel testing of the integrated technologies,” said Jim Bokos, Director for North America Sales at Averna. “Consequently, our new Infotainment Test Platform for Harman features the test expertise and powerful test tools needed to generate all necessary RF signals as well as capture key electrical, RF and audio measurements.”
“Harman’s infotainment systems are increasingly sophisticated, offering mobile users unparalleled user experience and support for the latest communications and entertainment technologies. We partnered with Averna to ensure these systems are tested to the highest standards,” commented Kevin Carstensen, Sr. Manager AME test engineering, Harman International. “This project has been a good experience, so much so that we look forward to co-presenting the technical achievements of this cost-effective and innovative solution at NIWeek 2012.”
Averna and Harman at NIWeek 2012, August 6-9 in Austin, TX Averna and Harman, plus a National Instruments representative, will present “Improving Infotainment System Testing, Picture Quality, Throughput and ROI” on Wednesday, August 8 at 4:45 pm in Room 15.
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